Telcordia software to calculate the reliability prediction of electronic equipment based on the Telcordia (Bellcore) TR and SR standards. Free trial. Telcordia Telecom Information SuperStore – Reliability Prediction Procedure for The following documents were fully or partly replaced by SR TR Bellcore TR – Download as PDF File .pdf), Text File .txt) or read online.
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The model takes the following form. The following documents were fully or partly replaced by SR These standards use a series of models for various categories of electronic, electrical and electro-mechanical components to predict steady-state failure rates which bellfore conditions, quality levels, electrical stress conditions and various other parameters affect.
Reliability and Maintainability Symp. In physics of failure approaches, the model parameters can be determined from trr-332 specs or from test data. A brief summary from the publications in industry, military and academia is presented next .
A model known as the modified Coffin-Manson model has been used successfully to model crack growth in solder due to repeated temperature cycling as the device is switched on and off. Because of dissatisfaction with military handbook methods for their commercial products, Bellcore designed its own reliability prediction standard for commercial telecommunication products. The Telcordia standard also documents beellcore recommended method for predicting serial system hardware reliability.
However, if you think your products do not exhibit a constant failure rate and therefore cannot be bellfore by an exponential distribution, the life characteristic usually will not be the MTBF. Some parameters in the curve function can be modified by integrating engineering knowledge.
For example, if the fan is broken in your laptop, the CPU will fail faster because of the high temperature. An extended range of complexity for devices, and the addition of new devices. Issue 4 of SR provides all the tools needed for predicting device and unit hardware reliability, and contains important revisions since the document was last issued.
The parts count method assumes typical operating conditions of part complexity, ambient temperature, various electrical stresses, operation mode and bellcoore called reference conditions. Several models are similar to the standard Eyring model.
A given electronic component will have multiple failure modes and the bel,core failure rate is equal to the sum of the failure rates of all modes i.
Electronic devices with aluminum or aluminum alloy with small percentages of copper and silicon metallization are subject to corrosion failures and therefore can be described with the following model :. At the end of the s, J. The beplcore rate for a part under the reference conditions is calculated as:.
It is probably the most internationally recognized empirical prediction method, by far. Parts Count Method II: Features Powerful and user friendly Telcordia telecom standard reliability prediction software Combine prediction methods for complex analysis Optimize designs to meet targeted goals Select components with regard to reliability and cost savings Be more accurate and efficient than with manual methods Take advantage of powerful ‘what if’ analytical tools Identify tr–332 areas in a system ttr-332 Build and open multiple systems and projects files Drag and drop components and systems between projects Powerful charting facilities ITEM ToolKit’s Reliability Prediction Modules ITEM ToolKit contains five modules for performing reliability prediction MTBF analysis.
Issue yr-332 of SR provides the only hardware reliability prediction procedure developed from the input and participation of a cross-section of major industrial companies.
Historically, this term has been used to denote the process of applying mathematical models and component data for the purpose of estimating the field reliability of a system before failure data are available for the system.
Empirical or Standards Based Prediction Methods Empirical prediction bellore are based on models developed from statistical curve fitting of historical failure data, which may have been collected in the field, in-house or from manufacturers.
Device and unit failure rate predictions generated using this procedure are applicable for commercial electronic products whose physical design, manufacture, installation, and reliability assurance practices meet the appropriate Telcordia or equivalent generic and product-specific requirements. It contains instructions for suppliers to follow when providing predictions of their device, unit, or serial system reliability. Revised environmental factors in Section 9 based on field data and experience.
Issue 4 of SR contains: Usually, the lower the values, the more conservative the estimation. It can also be used for: Finally, we will discuss life testing methods, which are used to determine reliability by testing a relatively large number of samples at their specified operation stresses or higher stresses and using statistical models to analyze the data. Several different approaches have been developed to achieve the reliability prediction of electronic systems and components.
The most common failure mode is “conductor open. This approach is based upon an understanding of the physical properties of the materials, operation processes and technologies used in the design. Contact us now for a price list, free trial or quotation: In contrast to empirical reliability prediction methods, which are based on the statistical analysis of historical failure data, a bellcote of failure approach is based on the understanding of the failure mechanism and applying the physics of failure model to the data.
Time plot and calculated B10 life. The advantages and disadvantages of empirical methods have been discussed a lot in the past three decades. This leads to the concept of reliability rr-332. In today’s competitive electronic products market, having higher reliability than competitors is one of the key factors for success. Since the parts may not tr-33 under the reference conditions, the real operating conditions will result in failure rates that are different from those given by the “parts count” method.
Method III is a statistical prediction of failure rate based on field tracking data collected in accordance with specific SR criteria.
Telcordia Electronic Reliability Prediction Software to TR and SR Standards
Figure 4 shows the data and calculated parameters. Fatigue failures can occur in electronic devices due to temperature cycling and thermal shock.
Powerful and user friendly Telcordia telecom standard reliability prediction software. Generally, bellcire reactions can be accelerated by increasing the system temperature.
Recommended methods for predicting device and unit hardware reliability. In using the bellore models, the model parameters can be determined from the design specifications or operating conditions.
Bellcore capacitor failure rate example.
Bellcore/Telcordia Reliability Prediction in Lambda Predict
On the other hand, with the life testing method, since the failure data from your own particular products are obtained, the prediction results usually are more accurate than those from a general standard or model. There are reasons for this variation. In this article, we will provide an overview of all three approaches. To download a free demonstration of our Bsllcore software click here.